Document Type
Patent
Publication Date
March 2005
Patent Number
6871528
Abstract
A method of producing a branched carbon nanotube (CNT) is disclosed. The branched CNT is used with an atomic force microscope having a cantilever and a tip and that is able to measure a surface of a substrate as well as an undercut feature of the substrate that protrudes from the surface. A catalytic material is deposited onto the tip of the microscope, and the catalytic material is subjected to chemical vapor deposition. This initiates growth of a primary branch of the branched carbon nanotube such that the primary branch extends from the tip. A secondary branch is then introduced to extend from the primary branch and produce the branched carbon nanotube. The primary branch interacts with the surface of the substrate and the secondary branch interacts with the undercut feature.
Application Number
10/413,598
Recommended Citation
Schlaf, Rudiger; Ren, Zhifeng F.; Wen, Jianguo; and Carnahan, David L., "Method of producing a branched carbon nanotube for use with an atomic force microscope" (2005). USF Patents. 707.
https://digitalcommons.usf.edu/usf_patents/707
Assignees
University of South Florida Boston College Nanolab, Inc.
Filing Date
04/14/2003
Primary/U.S. Class
73/05
