Document Type
Patent
Publication Date
September 2007
Patent Number
7268563
Abstract
An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature from 2K-300K. The cryostat probe is integrated with a commercial physical properties measurement system. The measurement probe includes a rotary-translation stage with coarse and fine screws that enable a user to make point contacts in a cryogenic, evacuated environment where the point contact junction can be controlled at room temperature by turning a knob. Copper wires are connected as electrical leads from an aluminum housing, descend down to a copper housing, for measurement, when contact is made by tip with a half-metal sample, such as CrO2. External current and voltage meters measure the current-voltage characteristics and data acquisition is performed using computer interface.
Application Number
11/162,057
Recommended Citation
Hariharan, Srikanth and Sanders, Jeff T., "Measurement of point contact Andreev-reflection characteristics of half-metallic thin films" (2007). USF Patents. 636.
https://digitalcommons.usf.edu/usf_patents/636
Assignees
University of South Florida
Filing Date
08/26/2005
Primary/U.S. Class
324/631
