Document Type

Article

Publication Date

February 2025

Patent Number

12229959

CPC

G06T 7/0012 , G06T 2207/10056 , G06T 2207/10064 , G06V 10/82

Abstract

Systems and methods for automated stereology using deep learning are disclosed. The systems include an update in the form of a semi-automatic approach for ground truth preparation in 3D stacks of microscopy images (disector stacks) for generating more training data. The systems also present an exemplary disector-based MIMO framework where all the planes of a 3D disector stack are analyzed as opposed to a single focus-stacked image (EDF image) per stack. The MIMO approach avoids the costly computations of 3D deep learning-based methods by using the 3D context of cells in disector stacks; and prevents stereological bias in the previous EDF-based method due to counting profiles rather than cells and under-counting overlap-ping/occluded cells. Taken together, these improvements support the view that AI-based automatic deep learning methods can accelerate the efficiency of unbiased stereology cell counts without a loss of accuracy or precision as compared to conventional manual stereology.

Application Number

17/971295

Assignees

UNIVERSITY OF SOUTH FLORIDA

Filing Date

10/21/2022

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