Document Type
Article
Publication Date
August 2023
Patent Number
11741594
CPC
G06T 7/0004, G06T 7/586, G06T 2207/10048, B29C 64/118, B29C 64/273, B29C 64/386
Abstract
A Pulsed Thermography (PT) system and method is provided utilizing a long duration pulse in combination with a radiant heat shield as a non-destructive testing method for quantitatively measuring defect depths within a 3D printed part and for characterizing layer-by-layer surface defects in the 3D printed part.
Application Number
17/520911
Recommended Citation
Crane, Nathan Brad and Pierce, III, James Randall, "Non-contact system and method for detecting defects in an additive manufacturing process" (2023). USF Patents. 1349.
https://digitalcommons.usf.edu/usf_patents/1349
Assignees
University of South Florida
Filing Date
11/08/2021
COinS
