Document Type
Article
Publication Date
July 2023
Patent Number
11709097
CPC
G01J 4/04, G01J 11/00
Abstract
An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
Application Number
17/379507
Recommended Citation
Shi, Zhimin; Hay, Darrick; Zhu, Ziyi; Zhou, Yiyu; and Boyd, Robert W., "Measurement apparatus of wavefront and polarization profile of vectorial optical fields" (2023). USF Patents. 1342.
https://digitalcommons.usf.edu/usf_patents/1342
Assignees
University of South Florida
Filing Date
07/19/2021
