Document Type
Article
Publication Date
November 2021
Patent Number
11170493
Abstract
A Pulsed Thermography (PT) system and method is provided utilizing a long duration pulse in combination with a radiant heat shield as a non-destructive testing method for quantitatively measuring defect depths within a 3D printed part and for characterizing layer-by-layer surface defects in the 3D printed part.
Application Number
16/780203
Recommended Citation
Crane, Nathan Brad and Pierce, III, James Randall, "Non-contact system and method for detecting defects in an additive manufacturing process" (2021). USF Patents. 1275.
https://digitalcommons.usf.edu/usf_patents/1275
Assignees
University of South Florida
Filing Date
02/03/2020
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