USF St. Petersburg campus Faculty Publications
International aspects of forensic science.
Document Type
Article
Publication Date
2010
ISBN
9780470686034
Publisher
Wiley-Blackwell
Recommended Citation
Houck, M.M. (2010). International aspects of forensic science. In N. Daéid, (Ed.). Fifty years of forensic science: A commentary. (pp: 273-276) Hoboken, NJ: Wiley-Blackwell.
Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License.
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Comments
Citation only. Full-text book is available through licensed access provided by the publisher. Members of the USF System may access the full-text through the authenticated link provided.