Graduation Year
2024
Document Type
Thesis
Degree
M.A.
Degree Name
Master of Arts (M.A.)
Degree Granting Department
Criminology
Major Professor
Jessica Grosholz, Ph.D.
Committee Member
Lyndsay Boggess, Ph.D.
Committee Member
Amanda Lewis, Ph.D.
Keywords
Wrongful Conviction, Victimization, Labeling, Stigma, In-Depth Interviews
Abstract
Exoneration and wrongful conviction complicate the field of criminology and the criminal justice system. Much of the scholarship on wrongful conviction focuses on the faults of the criminal justice system, such as false or misleading forensic evidence, false confessions, official misconduct, inadequate legal defense, and more. However, there is less research on the social, psychological, and economic impact of a wrongful conviction on those who have been wrongfully convicted and those associated with wrongful convictions (e.g., exoneree's loved ones). Recent studies indicate that social and psychological implications after a wrongful conviction may not only affect exonerees but also their loved ones. Due to this gap in the literature, I analyzed 36 in- depth semi-structured interviews with 19 exonerees and 17 loved ones to further understand how a wrongful conviction affects a loved ones' perceptions of an exoneree's guilt and innocence. Specifically, I examine how these perceptions of innocence and guilt are affected by several internal and external factors, which end up influencing the relationships between exonerees and their loved ones. This study finds that the consistent perspective of innocence strengthens the relationship between exonerees and their loved ones. This study's findings expand our understanding of the impact of wrongful convictions on exonerees and their loved ones, while also making several recommendations to the criminal justice system.
Scholar Commons Citation
McCullough, Martha E., "The Perception of Innocence and Guilt: Understanding Relationships Between Exonerees and Their Loved Ones" (2024). USF Tampa Graduate Theses and Dissertations.
https://digitalcommons.usf.edu/etd/10820
