An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.
Shi, Zhimin; Hay, Darrick; Zhu, Ziyi; Zhou, Yiyu; and Boyd, Robert W., "Measurement apparatus of wavefront and polarization profile of vectorial optical fields" (2021). USF Patents. 1256.
University of South Florida