The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.
Popescu, Adrian; Woods, Lilia M.; and Bondarev, Igor V., "Carbon nanotube oscillator surface profiling device and method of use" (2011). USF Patents. 444.
University of South Florida