Authors

Zhimin Shi

Document Type

Article

Publication Date

March 2020

Patent Number

10587345

CPC

H04B 10/556, H04B 10/70

Abstract

An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude, the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

Application Number

16/396618

Assignees

University of South Florida

Filing Date

04/26/2019

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