Basic Technique for Preparation of Down for Examination with the Scanning Electron Microscope

Authors

Roxie C. Laybourne
Beth Ann Sabo
Ann Morningstar

Creative Commons License

Terms of use for work posted in Scholar Commons.

Recommended Citation

Laybourne, Roxie C.; Sabo, Beth Ann; and Morningstar, Ann (1992) "Basic Technique for Preparation of Down for Examination with the Scanning Electron Microscope," The Auk: Vol. 109: Iss. 1, Article 26.
Available at: https://digitalcommons.usf.edu/auk/vol109/iss1/26